Modeling the Impact of Multi-Fingering Microwave MOSFETs on...

IEEE Transactions on Microwave Theory and Techniques 2014 / 12 Vol. 62; Iss. 12

Modeling the Impact of Multi-Fingering Microwave MOSFETs on the Source and Drain Resistances

Zarate-Rincon, Fabian, Murphy-Arteaga, Roberto S., Torres-Torres, Reydezel, Ortiz-Conde, Adelmo, Garcia-Sanchez, Francisco J.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2014.2366105
Date:
December, 2014
File:
PDF, 2.10 MB
english, 2014
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