Contribution of Electromagnetic Perturbation to the...

IEEE Transactions on Nuclear Science 2015 / 6 Vol. 62; Iss. 3

Contribution of Electromagnetic Perturbation to the Transient Response of an Electronic Circuit Exposed to a High Multi-MeV X-Ray Flux

Ribiere, M., Demarquay, S., Maulois, M., Maisonny, R., DaAlmeida, T., Toury, M., Crabos, B., Gonzalez, C., Garrigues, A., Delbos, C., Azais, B.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2417354
Date:
June, 2015
File:
PDF, 1.93 MB
english, 2015
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