Heavy-Ion Microbeam Fault Injection into SRAM-Based FPGA Implementations of Cryptographic Circuits
Li, Huiyun, Du, Guanghua, Shao, Cuiping, Dai, Liang, Xu, Guoqing, Guo, JinlongVolume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2423672
Date:
June, 2015
File:
PDF, 1.31 MB
english, 2015