ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - The Hysteresis Characteristics of Low Temperature (≤ 200 °) Silicon Nanocrystals Embedded in Silicon-Rich Silicon Nitride Films
Lee, Kyoung-Min, Hwang, Jae-Dam, Keum, Ki-Su, No, Kil-Sun, Hong, Wan-ShickYear:
2011
Language:
english
DOI:
10.1149/1.3647903
File:
PDF, 556 KB
english, 2011