Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
Trager-Cowan, C., Sweeney, F., Winkelmann, A., Wilkinson, A. J., Trimby, P. W., Day, A. P., Gholinia, A., Schmidt, N. H., Parbrook, P. J., Watson, I. M.Volume:
22
Language:
english
Journal:
Materials Science and Technology
DOI:
10.1179/174328406x130957
Date:
November, 2006
File:
PDF, 489 KB
english, 2006