Application of Hilbert–Huang transform for defect recognition in pulsed eddy current testing
Liu, Baoling, Huang, Pingjie, Hou, Dibo, Chen, Xiao, Zhang, GuangxinLanguage:
english
Journal:
Nondestructive Testing and Evaluation
DOI:
10.1080/10589759.2015.1034715
Date:
June, 2015
File:
PDF, 1.39 MB
english, 2015