Impact of Uniaxial Strain on Random Telegraph Noise in...

IEEE Transactions on Electron Devices 2015 / 3 Vol. 62; Iss. 3

Impact of Uniaxial Strain on Random Telegraph Noise in High- $k$ /Metal Gate pMOSFETs

Huang, Po-Chin, Chen, Jone F., Tsai, Shih Chang, Wu, San Lein, Tsai, Kai-Shiang, Kao, Tsung Hsien, Fang, Yean-Kuen, Lai, Chien-Ming, Hsu, Chia-Wei, Chen, Yi-Wen, Cheng, Osbert
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2391298
Date:
March, 2015
File:
PDF, 1.67 MB
english, 2015
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