Stacking fault energy of 6H-SiC and 4H-SiC single crystals
H. Hong, A. V. Samant, P. Pirouz, M.Volume:
80
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/014186100250615
Date:
April, 2000
File:
PDF, 511 KB
english, 2000