Temporally resolved Schwarzschild microscope for the...

Review of Scientific Instruments 2004 / 12 Vol. 75; Iss. 12

Temporally resolved Schwarzschild microscope for the characterization of extreme ultraviolet emission in laser-produced plasmas

Tao, Y., Nakai, M., Nishimura, H., Fujioka, S., Okuno, T., Fujiwara, T., Ueda, N., Miyanaga, N., Izawa, Y.
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Volume:
75
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1818891
Date:
December, 2004
File:
PDF, 200 KB
english, 2004
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