MODEL CHECKING A KNOWLEDGE EXCHANGE SCENARIO

Applied Artificial Intelligence 2004 / 10 Vol. 18; Iss. 9-10

MODEL CHECKING A KNOWLEDGE EXCHANGE SCENARIO

OTTERLOO, SIEUWERT VAN, DER, WIEBE VAN, WOOLDRIDGE, MICHAEL
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Volume:
18
Language:
english
Journal:
Applied Artificial Intelligence
DOI:
10.1080/08839510490514832
Date:
October, 2004
File:
PDF, 271 KB
english, 2004
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