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[ECS 24th Symposium on Microelectronics Technology and Devices - Natal, Brazil (August 31 - September 3, 2009)] ECS Transactions - Extraction of MOSFET Model Parameters from the Measured Source-to-drain Resistance
Garcia-Sanchez, Francisco J., Muci, Juan, Lugo Muñoz, Denise C., Latorre Reya, Alvaro A., Ortiz-Conde, Adelmo, Ho, Ching S., Liou, Juin J.Year:
2009
Language:
english
DOI:
10.1149/1.3183739
File:
PDF, 450 KB
english, 2009