Development of C[sub 60] plasma ion source for...

Review of Scientific Instruments 2008 Vol. 79; Iss. 2

Development of C[sub 60] plasma ion source for time-of-flight secondary ion mass spectrometry applications

Ji, Qing, Chen, Ye, Ji, Lili, Hahto, Sami, Leung, Ka-Ngo, Lee, Tae Geol, Moon, Dae Won
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Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2804912
File:
PDF, 417 KB
english, 2008
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