STI edge effect on the series resistance of CMOS Schottky...

Microwave and Optical Technology Letters 2014 / 04 Vol. 56; Iss. 4

STI edge effect on the series resistance of CMOS Schottky barrier diodes

Lee, Jaelin, Kim, Suna, Hong, Jong-Phil, Lee, Sang-Gug
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Volume:
56
Language:
english
Journal:
Microwave and Optical Technology Letters
DOI:
10.1002/mop.28218
Date:
April, 2014
File:
PDF, 382 KB
english, 2014
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