Failure mechanism for input buffer under CDM test

Electronics Letters 2014 / 04 Vol. 50; Iss. 9

Failure mechanism for input buffer under CDM test

Weng, Wu-Te, Lee, Jian-Hsing, Hung, Chung-Yu, Chiu, Chien-Wei, Lien, Chen-Hsin, Su, Hung-Der, Lo, Kuo-Hsuan, Kao, Tzu-Cheng
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Volume:
50
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2013.4094
Date:
April, 2014
File:
PDF, 445 KB
english, 2014
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