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Two-stage hot-carrier-induced degradation of p-type LDMOS transistors
Ai, Deng-Ren, Chen, Jone F., Chen, Tzu-HsiangVolume:
50
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el.2014.2901
Date:
November, 2014
File:
PDF, 601 KB
english, 2014