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Time-of-flight analyzer system to detect reflected particles from a solid surface following low-energy particle injection
Yamaoka, H., Tanaka, N., Tsumori, K., Nishiura, M., Kenmotsu, T., Hirouchi, T., Kisaki, M., Shinto, K., Sasao, M., Matsumoto, Y., Wada, M.Volume:
79
Year:
2008
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2796173
File:
PDF, 495 KB
english, 2008