An in-vacuum x-ray diffraction microscope for use in the...

Review of Scientific Instruments 2012 Vol. 83; Iss. 3

An in-vacuum x-ray diffraction microscope for use in the 0.7–2.9 keV range

Vine, D. J., Williams, G. J., Clark, J. N., Putkunz, C. T., Pfeifer, M. A., Legnini, D., Roehrig, C., Wrobel, E., Huwald, E., van Riessen, G., Abbey, B., Beetz, T., Irwin, J., Feser, M., Hornberger, B
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Volume:
83
Year:
2012
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3688655
File:
PDF, 1.15 MB
english, 2012
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