Combining low-energy electron microscopy and scanning probe...

Review of Scientific Instruments 2014 / 04 Vol. 85; Iss. 4

Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holder

Cheynis, F., Leroy, F., Ranguis, A., Detailleur, B., Bindzi, P., Veit, C., Bon, W., Müller, P.
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Volume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4871437
Date:
April, 2014
File:
PDF, 1.66 MB
english, 2014
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