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Bulk sensitive hard x-ray photoemission electron microscopy
Patt, M., Wiemann, C., Weber, N., Escher, M., Gloskovskii, A., Drube, W., Merkel, M., Schneider, C. M.Volume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4902141
Date:
November, 2014
File:
PDF, 1013 KB
english, 2014