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Atomic structures of Si and Ge Σ = 13 [0 0 1] tilt grain boundaries studied by high-resolution electron microscopy and atomistic simulations
Rouvière, Jean-Luc, Lançon, Frédéric, Hardouin Duparc, OlivierVolume:
93
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786435.2013.780135
Date:
April, 2013
File:
PDF, 560 KB
english, 2013