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High- and low-energy x-ray photoelectron techniques for compositional depth profiles: destructive versus non-destructive methods
Benito, Noelia, Galindo, Ramón Escobar, Rubio-Zuazo, Juan, Castro, Germán R, Palacio, CarlosVolume:
46
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/46/6/065310
Date:
February, 2013
File:
PDF, 2.14 MB
english, 2013