Semiconductor properties of Cu-based delafossites revealed...

Journal of Physics Condensed Matter 2006 / 02 Vol. 18; Iss. 5

Semiconductor properties of Cu-based delafossites revealed by an electric field gradient study

Lalić, M V, Mestnik-Filho, J
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Volume:
18
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/18/5/015
Date:
February, 2006
File:
PDF, 229 KB
english, 2006
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