Characterization of nanostructured copper films for...

COMPEL Int J for Computation and Maths in Electrical and Electronic Eng 2012 / 07 Vol. 31; Iss. 4

Characterization of nanostructured copper films for electromagnetic shield

Antunes, Carlos L., Desideri, Daniele, Maschio, Alvise, Bolzan, Marco, Natali, Marco, Spolaore, Monica
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Volume:
31
Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/03321641211227366
Date:
July, 2012
File:
PDF, 260 KB
english, 2012
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