[IEEE 2014 IEEE 17th International Conference on Computational Science and Engineering (CSE) - Chengdu, China (2014.12.19-2014.12.21)] 2014 IEEE 17th International Conference on Computational Science and Engineering - Improving Prediction Robustness of VAB-SVM for Cross-Project Defect Prediction
Ryu, Duksan, Choi, Okjoo, Baik, JongmoonYear:
2014
Language:
english
DOI:
10.1109/cse.2014.198
File:
PDF, 361 KB
english, 2014