[IEEE 2014 26th International Conference on Microelectronics (ICM) - Doha, Qatar (2014.12.14-2014.12.17)] 2014 26th International Conference on Microelectronics (ICM) - Modeling of faulty implantable MEMS pressure sensors
Miguel, J.A., Lechuga, Y., Martinez, M., Bracho, S.Year:
2014
Language:
english
DOI:
10.1109/icm.2014.7071811
File:
PDF, 799 KB
english, 2014