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Fitting Cells Into a Narrow $V_{T}$ Interval: Physical Constraints Along the Lifetime of an Extremely Scaled NAND Flash Memory Array
Paolucci, Giovanni Maria, Compagnoni, Christian Monzio, Spinelli, Alessandro S., Lacaita, Andrea L., Goda, AkiraVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2414711
Date:
May, 2015
File:
PDF, 2.70 MB
english, 2015