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Fabrication of Magnetic Force Microscopy Tips via Electrodeposition and Focused Ion Beam Milling
Cespedes, O., Luu, A., Rhen, F., Coey, J.Volume:
44
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2008.2002866
Date:
November, 2008
File:
PDF, 828 KB
english, 2008