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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Technology of classification on fruit defects based on infrared thermography
Zhou, Jianmin, Zhou, Qixian, Liu, Juanjuan, Xu, Dongdong, Shu, Lili, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.863819
File:
PDF, 325 KB
english, 2010