SPIE Proceedings [SPIE SPIE Solar Energy + Technology - San Diego, California, USA (Sunday 12 August 2012)] Reliability of Photovoltaic Cells, Modules, Components, and Systems V - Electrical bias as an alternate method for reproducible measurement of copper indium gallium diselenide (CIGS) photovoltaic modules
Deline, Chris, Stokes, Adam, Silverman, Timothy J., Rummel, Steve, Jordan, Dirk, Kurtz, Sarah, Dhere, Neelkanth G., Wohlgemuth, John H.Volume:
8472
Year:
2012
Language:
english
DOI:
10.1117/12.929899
File:
PDF, 900 KB
english, 2012