Raman Study of Misfit Strain and Its Relaxation in ZnSe...

Japanese Journal of Applied Physics 1987 / 5 Vol. 26; Iss. Part 2, No

Raman Study of Misfit Strain and Its Relaxation in ZnSe Layers Grown on GaAs Substrates

Matsumoto, Takashi, Kato, Takamasa, Hosoki, Mitsuru, Ishida, Tetsuro
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Volume:
26
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.26.l576
Date:
May, 1987
File:
PDF, 504 KB
1987
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