Polychromatic Single-Shot Spectroscopy on SOI-FET Trapped...

Polychromatic Single-Shot Spectroscopy on SOI-FET Trapped Electrons

Tenorio-Pearl, J. O., Milne, W. I., Hasko, D. G.
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Volume:
54
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/05401.0209ecst
Date:
June, 2013
File:
PDF, 613 KB
english, 2013
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