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[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Defects, Junction Leakage and Electrical Performance of Ge pFET Devices
Eneman, Geert, Simoen, Eddy, Yang, Rui, De Jaeger, Brice, Wang, Gang, Mitard, Jerome, Hellings, Geert, Brunco, David, Loo, Roger, De Meyer, Kristin, Caymax, Matty R., Claeys, Cor, Meuris, Marc, Heyns,Year:
2009
Language:
english
DOI:
10.1149/1.3118945
File:
PDF, 606 KB
english, 2009