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Approximate Tolerance Limits Under Log-Location-Scale Regression Models in the Presence of Censoring
Emura, Takeshi, Wang, HsiuyingVolume:
52
Language:
english
Journal:
Technometrics
DOI:
10.1198/TECH.2010.09025
Date:
August, 2010
File:
PDF, 343 KB
english, 2010