Development, Integration and Qualification of a Measurement System for Accurate and Fast Placements of Flipchips
de Kruif, Bas J., de Hoog, Thomas, Hoogstrate, André, van der Zon, BenVolume:
516
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.516.600
Date:
June, 2012
File:
PDF, 637 KB
english, 2012