Inductance deep-level transient spectroscopy for...

Review of Scientific Instruments 2003 Vol. 74; Iss. 10

Inductance deep-level transient spectroscopy for determining temperature-dependent resistance and capacitance of Schottky diodes

Rangel-Kuoppa, V. T., Pessa, M.
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Volume:
74
Year:
2003
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1610786
File:
PDF, 57 KB
english, 2003
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