NBTI in Nanoscale MOSFETs—The Ultimate Modeling...

IEEE Transactions on Electron Devices 2014 / 11 Vol. 61; Iss. 11

NBTI in Nanoscale MOSFETs—The Ultimate Modeling Benchmark

Grasser, Tibor, Rott, Karina, Reisinger, Hans, Waltl, Michael, Schanovsky, Franz, Kaczer, Ben
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2353578
Date:
November, 2014
File:
PDF, 1.50 MB
english, 2014
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