Read Challenges in Crossbar Memories With Nanoscale...

IEEE Transactions on Nanotechnology 2015 / 5 Vol. 14; Iss. 3

Read Challenges in Crossbar Memories With Nanoscale Bidirectional Diodes and ReRAM Devices

Li, Yibo, Chen, Wenbo, Lu, Wenchao, Jha, Rashmi
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2015.2403772
Date:
May, 2015
File:
PDF, 762 KB
english, 2015
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