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Read Challenges in Crossbar Memories With Nanoscale Bidirectional Diodes and ReRAM Devices
Li, Yibo, Chen, Wenbo, Lu, Wenchao, Jha, RashmiVolume:
14
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2015.2403772
Date:
May, 2015
File:
PDF, 762 KB
english, 2015