SPIE Proceedings [SPIE SPIE Optical Systems Design - Marseille, France (Monday 5 September 2011)] Optical Fabrication, Testing, and Metrology IV - Multimodal scattering facilities and modelization tools for a comprehensive investigation of optical coatings
Zerrad, Myriam, Lequime, Michel, Amra, Claude, Duparré, Angela, Geyl, RolandVolume:
8169
Year:
2011
Language:
english
DOI:
10.1117/12.896730
File:
PDF, 7.02 MB
english, 2011