Highly Robust Flexible Oxide Thin-Film Transistors by Bulk...

IEEE Electron Device Letters 2015 / 8 Vol. 36; Iss. 8

Highly Robust Flexible Oxide Thin-Film Transistors by Bulk Accumulation

Li, Xiuling, Billah, Mohammad Masum, Mativenga, Mallory, Geng, Di, Kim, Yong-Hwan, Kim, Tae-Woong, Seol, Young-Gug, Jang, Jin
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Volume:
36
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2015.2451005
Date:
August, 2015
File:
PDF, 473 KB
english, 2015
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