EM Measurements Between MV Switching Sources and Colocated...

IEEE Transactions on Electromagnetic Compatibility 2015 / 6 Vol. 57; Iss. 3

EM Measurements Between MV Switching Sources and Colocated Sensitive Circuit

Li, Peng, Huang, Daochun, Ruan, Jiangjun, Niu, Xiaobo
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Volume:
57
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2015.2400230
Date:
June, 2015
File:
PDF, 708 KB
english, 2015
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