![](/img/cover-not-exists.png)
EM Measurements Between MV Switching Sources and Colocated Sensitive Circuit
Li, Peng, Huang, Daochun, Ruan, Jiangjun, Niu, XiaoboVolume:
57
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2015.2400230
Date:
June, 2015
File:
PDF, 708 KB
english, 2015