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SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, USA (Monday 5 May 2014)] Infrared Technology and Applications XL - Multi-wafer growth of GaInAs photodetectors on 4" InP by MOCVD for SWIR imaging applications
Andresen, Bjørn F., Fulop, Gabor F., Hanson, Charles M., Norton, Paul R., Furlong, Mark J., Mattingley, Mark, Lim, Sung Wook, Geen, Matthew, Jones, WynneVolume:
9070
Year:
2014
Language:
english
DOI:
10.1117/12.2053970
File:
PDF, 832 KB
english, 2014