SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Videometrics, Range Imaging, and Applications XIII - Light-field camera design for high-accuracy depth estimation
Remondino, Fabio, Shortis, Mark R., Diebold, M., Blum, O., Gutsche, M., Wanner, S., Garbe, C., Baker, H., Jähne, B.Volume:
9528
Year:
2015
Language:
english
DOI:
10.1117/12.2184845
File:
PDF, 4.79 MB
english, 2015