Filtering out slow-scan drifts in atomic force microscopy...

Journal of Strain Analysis for Engineering Design 2011 / 07 Vol. 46; Iss. 5

Filtering out slow-scan drifts in atomic force microscopy images

Teyssedre, H., Roux, S., Regnier, G., Tracz, A.
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Volume:
46
Language:
english
Journal:
The Journal of Strain Analysis for Engineering Design
DOI:
10.1177/0309324711401794
Date:
July, 2011
File:
PDF, 1.11 MB
english, 2011
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