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Raman study on residual strains in thin 3C-SiC epitaxial layers grown on Si(001)
Jianjun Zhu, Suying Liu, Junwu LiangVolume:
368
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(00)00789-6
File:
PDF, 115 KB
english, 2000