Applicability of ALE TiN films as Cu/Si diffusion barriers
Dong-Jin Kim, Young-Bae Jung, Myoung-Bok Lee, Yong-Hyun Lee, Jong-Hyun Lee, Jung-Hee LeeVolume:
372
Year:
2000
Language:
english
Pages:
8
DOI:
10.1016/s0040-6090(00)01049-x
File:
PDF, 710 KB
english, 2000