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In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope
González-Jorge, Higinio, Alvarez-Valado, Victor, Valencia, Jose Luis, Torres, SoledadVolume:
10
Language:
english
Journal:
Sensors
DOI:
10.3390/s100404002
Date:
April, 2010
File:
PDF, 761 KB
english, 2010