Grain boundary trap passivation in polysilicon thin film...

Thin Solid Films 2001 Vol. 383; Iss. 1-2

Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise

A. Mercha, L. Pichon, R. Carin, K. Mourgues, O. Bonnaud
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Volume:
383
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0040-6090(00)01795-8
File:
PDF, 120 KB
english, 2001
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