Optical properties of amorphous and polycrystalline...

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

E. Franke, M. Schubert, C.L. Trimble, M.J. DeVries, J.A. Woollam
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
388
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0040-6090(00)01881-2
File:
PDF, 197 KB
english, 2001
Conversion to is in progress
Conversion to is failed