Non-destructive evaluation of delamination in ceramic thin...

Thin Solid Films 2001 Vol. 385; Iss. 1-2

Non-destructive evaluation of delamination in ceramic thin films on metal substrates by scanning electron microscopy

Srinivasan Rangarajan, Alexander H. King
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Volume:
385
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0040-6090(00)01904-0
File:
PDF, 1.35 MB
english, 2001
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