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In situ monitoring of optical coatings on architectural glass and comparison of the accuracy of the layer thickness attainable with ellipsometry and photometry
M. Vergöhl, N. Malkomes, T. Matthée, G. Bräuer, U. Richter, F.-W. Nickol, J. BruchVolume:
392
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0040-6090(01)01040-9
File:
PDF, 769 KB
english, 2001